[{"data": {"name": "Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "Martin Magnuson", "@type": "Person"}, {"name": "Maurizio Mattesini", "@type": "Person"}, {"name": "Ngo Van Nong", "@type": "Person"}, {"name": "Per Eklund", "@type": "Person"}, {"name": "Lars Hultman", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "https://digital.csic.es/bitstream/10261/64208/1/PRB_2012_85_195134.pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "American Physical Society (APS)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1103/physrevb.85.195134", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCAU9qQukx9G5-CT4s2JVysKEXC-CD9nURBL2cSAn-CRAEuCpYmc5GS", "propertyID": "ISCC"}], "datePublished": "2012-05-22"}, "schema": "schema.org", "mediatype": "application/ld+json"}]