[{"data": {"name": "QM/MM Methods for Crystalline Defects. Part 1: Locality of the Tight Binding Model", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "Huajie Chen", "@type": "Person"}, {"name": "Christoph Ortner", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "http://arxiv.org/pdf/1505.05541", "encodingFormat": "application/pdf"}], "publisher": {"name": "Society for Industrial & Applied Mathematics (SIAM)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1137/15m1022628", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCrvzpEJsccTv-CTBPr14f7ZZjd-CDTFL563eQGy9-CRgTMjgPHy4sQ", "propertyID": "ISCC"}], "datePublished": "2016-01-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]