[{"data": {"name": "Titanium Oxide Crystallization and Interface Defect Passivation for High Performance Insulator-Protected Schottky Junction MIS Photoanodes", "@type": "ScholarlyArticle", "genre": "component", "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "https://doi.org/10.1021/acsami.6b03688.s001", "encodingFormat": "application/pdf"}], "publisher": {"name": "American Chemical Society (ACS)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1021/acsami.6b03688.s001", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCNqTDMtxJjDJ-CT3GCZWkfV6NE-CDbGVBghT7QEz-CRtMWV9V8Td49", "propertyID": "ISCC"}]}, "schema": "schema.org", "mediatype": "application/ld+json"}]