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Core Data

28C9YLSBXdURA
ISCC-ID - digital asset identifier
CCNVTw66Qymh1-CTGBSvEnRqyRS-CDH2hCxmYQBxj-CRV4yohPuoiu4
ISCC-CODE - digital asset descriptor
2QTa5N4aeSrCB2MLoPdPF4AsTjstJgcLTnd
PUBLIC-KEY or WALLET-ADDRESS of DECLARING PARTY
0
Number of times updated

Seed Metadata (Immutable)

scheduling semiconductor device test operations on multihead testers

Ledger Reference

coblo
Source Ledger/Blockchain
12409763
N-th ISCC Decleration on source ledger
6a8833fcdb5483647bd149947f2f04e7c061ab72f6c59ae31aa3939107ac5ff9
Hash of block that includes the ISCC-DECLARATION
7e0f4ccaaddf7b9eb142752a517afe35d14756c3e1a16729a5333b635aaf3147
Hash of transaction that includes the ISCC-DECLERATION
0
Output index that includes ISCC-DECLERATION (UTXO based chains)

Mutable Metadata

[{"data": {"name": "Scheduling semiconductor device test operations on multihead testers", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "T. Freed", "@type": "Person"}, {"name": "R.C. Leachman", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "https://digitalcommons.calpoly.edu/cgi/viewcontent.cgi?article=1074&context=ime_fac", "encodingFormat": "application/pdf"}], "publisher": {"name": "Institute of Electrical and Electronics Engineers (IEEE)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1109/66.806130", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCNVTw66Qymh1-CTGBSvEnRqyRS-CDH2hCxmYQBxj-CRV4yohPuoiu4", "propertyID": "ISCC"}], "datePublished": "1999-01-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]
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