[{"data": {"name": "Chern number of thin films of the topological insulatorBi2Se3", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "Huichao Li", "@type": "Person"}, {"name": "L. Sheng", "@type": "Person"}, {"name": "D. N. Sheng", "@type": "Person"}, {"name": "D. Y. Xing", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "http://scholarworks.csun.edu/bitstream/10211.2/3391/1/ShengDN20101005.pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "American Physical Society (APS)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1103/physrevb.82.165104", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCgxTpcjtKCAC-CTANhTF2T31S8-CDdfi38BasPvQ-CRbs6ZmHk22U7", "propertyID": "ISCC"}], "datePublished": "2010-10-05"}, "schema": "schema.org", "mediatype": "application/ld+json"}]