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Core Data

28CrXRb5z9wMh
ISCC-ID - digital asset identifier
CCLqQpZFYeR9c-CTLvBsWd2UwMT-CDry4nk4SvsQx-CRrcak9f8x5un
ISCC-CODE - digital asset descriptor
2QTa5N4aeSrCB2MLoPdPF4AsTjstJgcLTnd
PUBLIC-KEY or WALLET-ADDRESS of DECLARING PARTY
0
Number of times updated

Seed Metadata (Immutable)

thermalsafe test scheduling for corebased systemonchip integrated circuits

Ledger Reference

coblo
Source Ledger/Blockchain
488392
N-th ISCC Decleration on source ledger
4bdee083b4e02a4a95cb08de61e39907f0b1fd8e282023939ca26e1016e5c9f9
Hash of block that includes the ISCC-DECLARATION
55bfd97aeb2d9e1a8afc6a99ea32e9eb666c086400113f002ec9827444cb9bca
Hash of transaction that includes the ISCC-DECLERATION
0
Output index that includes ISCC-DECLERATION (UTXO based chains)

Mutable Metadata

[{"data": {"name": "Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "P. Rosinger", "@type": "Person"}, {"name": "B.M. Al-Hashimi", "@type": "Person"}, {"name": "K. Chakrabarty", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "http://eprints.ecs.soton.ac.uk/11582/1/main.pdf", "encodingFormat": "application/pdf"}, {"@type": "MediaObject", "contentUrl": "https://eprints.soton.ac.uk/261582/1/main.pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "Institute of Electrical and Electronics Engineers (IEEE)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1109/tcad.2006.873898", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCLqQpZFYeR9c-CTLvBsWd2UwMT-CDry4nk4SvsQx-CRrcak9f8x5un", "propertyID": "ISCC"}], "datePublished": "2006-11-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]
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