[{"data": {"name": "Noise investigations on thick film resistors", "@type": "ScholarlyArticle", "genre": "journal-article", "license": "cc-by", "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "http://downloads.hindawi.com/journals/apec/1984/213830.pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "Elsevier BV", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1016/0026-2714(84)91010-2", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCfnEnc8ChFqh-CT4Z88GJQkYts-CDjCmsRnNLXXp-CRUXLmWUid7rN", "propertyID": "ISCC"}], "datePublished": "1984-01-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]