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Core Data

28CrZaCJpZSJY
ISCC-ID - digital asset identifier
CCfPHKcn7NwLM-CTLL1tFJyFXh7-CDhjYd1Ptdp6z-CRKKmG2acswts
ISCC-CODE - digital asset descriptor
2QTa5N4aeSrCB2MLoPdPF4AsTjstJgcLTnd
PUBLIC-KEY or WALLET-ADDRESS of DECLARING PARTY
0
Number of times updated

Seed Metadata (Immutable)

surface roughness measurement by optical pattern projection

Ledger Reference

coblo
Source Ledger/Blockchain
56585
N-th ISCC Decleration on source ledger
2b6eda820ad6cd9729829ba6bda8df8deb7d156a12bbef04a037d9c977d1f908
Hash of block that includes the ISCC-DECLARATION
3740f1b506343a3ae20de400eaf6fcf0939211ac3de74b1ea0cceee169846c3d
Hash of transaction that includes the ISCC-DECLERATION
0
Output index that includes ISCC-DECLERATION (UTXO based chains)

Mutable Metadata

[{"data": {"name": "Surface Roughness Measurement by Optical Pattern Projection", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "Takahiko INARI", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "https://www.jstage.jst.go.jp/article/sicetr1965/34/11/34_11_1539/_pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "The Society of Instrument and Control Engineers", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.9746/sicetr1965.34.1539", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CCfPHKcn7NwLM-CTLL1tFJyFXh7-CDhjYd1Ptdp6z-CRKKmG2acswts", "propertyID": "ISCC"}], "datePublished": "1998-01-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]
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