[{"data": {"name": "Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films", "@type": "ScholarlyArticle", "genre": "journal-article", "author": [{"name": "Jim Fitch", "@type": "Person"}, {"name": "Robbyn Trappen", "@type": "Person"}, {"name": "Chih-Yeh Huang", "@type": "Person"}, {"name": "Jinling Zhou", "@type": "Person"}, {"name": "Guerau Cabrera", "@type": "Person"}, {"name": "Shuai Dong", "@type": "Person"}, {"name": "Shalini Kumari", "@type": "Person"}, {"name": "Mikel B. Holcomb", "@type": "Person"}, {"name": "James M. LeBeau", "@type": "Person"}], "@context": "http://schema.org/", "encoding": [{"@type": "MediaObject", "contentUrl": "https://www.cambridge.org/core/services/aop-cambridge-core/content/view/09A866F2D9F21C8BB0C7264A30AD0920/S1431927617008662a.pdf/div-class-title-combined-eels-and-xas-analysis-of-the-relationship-between-depth-dependence-and-valence-in-lsmo-thin-films-div.pdf", "encodingFormat": "application/pdf"}], "publisher": {"name": "Cambridge University Press (CUP)", "@type": "Organization"}, "identifier": [{"@type": "PropertyValue", "value": "10.1017/s1431927617008662", "propertyID": "DOI"}, {"@type": "PropertyValue", "value": "CChVrW8NUjWbs-CTiTZQKH1d2vU-CDmYfUCabwuj5-CRaQmTJeHataA", "propertyID": "ISCC"}], "datePublished": "2017-07-01"}, "schema": "schema.org", "mediatype": "application/ld+json"}]